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ESEC/FSE 2021
Thu 19 - Sat 28 August 2021 Clowdr Platform
Wed 25 Aug 2021 17:10 - 17:15 - Testing—Failures and Fault Localization Chair(s): Shaukat Ali
Thu 26 Aug 2021 05:10 - 05:15 - Testing—Failures and Fault Localization Chair(s): Massimiliano Di Penta

Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one challenging task is: whether we can locate buggy program prior to the appearance of the defect symptom (e.g., when buggy program elements are being committed to a version control system). We refer to this type of defect localization as \textbf{``Just-In-Time (JIT) Defect localization''}. Although many prior studies have proposed various JIT defect identification methods to identify whether a new change is buggy, these prior methods do not locate the suspicious positions. Thus, JIT defect localization is the next step of JIT defect identification (i.e., after a buggy change is identified, suspicious source code lines are located).

To address this problem, we propose a two-phase framework, i.e., JIT defect identification and JIT defect localization. Given a new change, JIT defect identification will identify it as buggy change or clean change first. If a new change is identified as buggy, JIT defect localization will rank the source code lines introduced by the new change according to their suspiciousness scores. The source code lines ranked at the top of the list are estimated as the defect location. For JIT defect identification phase, we use 14 change-level features to build a classifier by following existing approach. For JIT defect localization phase, we propose a JIT defect localization approach that leverages software naturalness with the N-gram model. To evaluate the proposed framework, we conduct an empirical study on 14 open source projects with a total of 177,250 changes. The results show that software naturalness is effective for our JIT defect localization. Our model achieves a reasonable performance, and outperforms the two baselines (i.e., random guess and a static bug finder (i.e., PMD)) by a substantial margin in terms of four ranking measures.

Wed 25 Aug

Displayed time zone: Athens change

17:00 - 18:00
Testing—Failures and Fault LocalizationDemonstrations / Research Papers / Journal First / Ideas, Visions and Reflections +12h
Chair(s): Shaukat Ali Simula Research Lab
17:00
10m
Paper
A Qualitative Study of the Benefits and Costs of Logging from Developers' Perspectives: A Journal First Presentation Proposal
Journal First
Heng Li Polytechnique Montréal, Weiyi Shang Concordia University, Bram Adams Queens University, Mohammed Sayagh ETS Montreal, University of Quebec, Ahmed E. Hassan Queen's University
17:10
5m
Paper
Just-In-Time Defect Identification and Localization: A Two-Phase Framework
Journal First
Meng Yan Chongqing University, Xin Xia Huawei Technologies, Yuanrui Fan Zhejiang University, David Lo Singapore Management University, Ahmed E. Hassan Queen's University, Shanping Li Zhejiang University
17:15
5m
Paper
New Visions on Metamorphic Testing after a Quarter of a Century of Inception
Ideas, Visions and Reflections
Tsong Yueh Chen Swinburne University of Technology, T. H. Tse University of Hong Kong
DOI
17:20
5m
Paper
AlloyFL: A Fault Localization Framework for Alloy
Demonstrations
Tanvir Ahmed Khan University of Texas at Arlington, Allison Sullivan University of Texas at Arlington, Kaiyuan Wang Google
DOI Media Attached
17:25
5m
Paper
BF-Detector: An Automated Tool for CI Build Failure Detection
Demonstrations
Islem Saidani ETS, Ali Ouni ETS, Moataz Chouchen ETS, Mohamed Wiem Mkaouer Rochester Institute of Technology
DOI
17:30
30m
Live Q&A
Q&A (Testing—Failures and Fault Localization)
Research Papers

Thu 26 Aug

Displayed time zone: Athens change

05:00 - 06:00
Testing—Failures and Fault LocalizationDemonstrations / Ideas, Visions and Reflections / Journal First / Research Papers
Chair(s): Massimiliano Di Penta University of Sannio
05:00
10m
Paper
A Qualitative Study of the Benefits and Costs of Logging from Developers' Perspectives: A Journal First Presentation Proposal
Journal First
Heng Li Polytechnique Montréal, Weiyi Shang Concordia University, Bram Adams Queens University, Mohammed Sayagh ETS Montreal, University of Quebec, Ahmed E. Hassan Queen's University
05:10
5m
Paper
Just-In-Time Defect Identification and Localization: A Two-Phase Framework
Journal First
Meng Yan Chongqing University, Xin Xia Huawei Technologies, Yuanrui Fan Zhejiang University, David Lo Singapore Management University, Ahmed E. Hassan Queen's University, Shanping Li Zhejiang University
05:15
5m
Paper
New Visions on Metamorphic Testing after a Quarter of a Century of Inception
Ideas, Visions and Reflections
Tsong Yueh Chen Swinburne University of Technology, T. H. Tse University of Hong Kong
DOI
05:20
5m
Paper
AlloyFL: A Fault Localization Framework for Alloy
Demonstrations
Tanvir Ahmed Khan University of Texas at Arlington, Allison Sullivan University of Texas at Arlington, Kaiyuan Wang Google
DOI Media Attached
05:25
5m
Paper
BF-Detector: An Automated Tool for CI Build Failure Detection
Demonstrations
Islem Saidani ETS, Ali Ouni ETS, Moataz Chouchen ETS, Mohamed Wiem Mkaouer Rochester Institute of Technology
DOI
05:30
30m
Live Q&A
Q&A (Testing—Failures and Fault Localization)
Research Papers